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Hello
The CC pin and VBUS are exposed when viewed from the outside, such as when Type-C is inserted and removed continuously, and when the connector is first inserted, 5V is momentarily applied to the IC or FET.
As a result, there is a question as to whether it will damage over and over again.Also, they want to know if it has the proof stress to withstand noise such as static electricity. Furthermore, there are only capacitors on the CC pin and VBUS lines.
Q) What is the durability of CYPD3177 regarding the above concerns?
Best Regards,
Arai
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USB EZ-PD Type-C
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Hi,
The EZ-PD BCR CYPD3177 has system level ESD protection. The details are as below,
- The ESD protection is present on the following pins,
CC, VBUS_IN, DC_OUT, D+, D-, HPI_SDA and HPI_SCL pins
- ± 8-kV contact discharge and ±15-kV air gap discharge based on IEC61000-4-2 level 4C.
- It also has VBUS to CC Short Protection.
The decoupling capacitors are connected to suppress the power supply noise on VBUS, VSYS, VDDD,
VDDIO, VCCD, and VCONN pins.
A 390-pF decoupling capacitor should be connected to CC lines (CC1, CC2) to maintain the signal quality at the signaling rate of 300 kHz.
Please let me know if this explanation has answered your doubt.
Regards,
Abhilash P
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Hi,
The EZ-PD BCR CYPD3177 has system level ESD protection. The details are as below,
- The ESD protection is present on the following pins,
CC, VBUS_IN, DC_OUT, D+, D-, HPI_SDA and HPI_SCL pins
- ± 8-kV contact discharge and ±15-kV air gap discharge based on IEC61000-4-2 level 4C.
- It also has VBUS to CC Short Protection.
The decoupling capacitors are connected to suppress the power supply noise on VBUS, VSYS, VDDD,
VDDIO, VCCD, and VCONN pins.
A 390-pF decoupling capacitor should be connected to CC lines (CC1, CC2) to maintain the signal quality at the signaling rate of 300 kHz.
Please let me know if this explanation has answered your doubt.
Regards,
Abhilash P
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Hello
Thank you for your reply. I am understanding the ESD protection for BCR device.
But, is there any information that can be provided about the proof stress of the BCR device itself by inserting and removing the Type-C connector? Specifically, They would like to know the strength (guaranteed value) against the influence of the Type-C connector insertion / removal test results on the BCR device.
Furthermore, how much proof stress should be considered against sudden changes such as transient phenomena when inserting cables?
Regarding the above, is there any information that can indicate the proof stress (guaranteable value) as a BCR device with specific numerical values?
Best Regards
Arai
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Hi,
Sorry, we don't have such information for BCR kit.
But considering a general USB type C receptacle, its durability is around 10,000 cycles.
Regards,
Abhilash P
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Hello Abhilash san
Thank you for your reply.
>But considering a general USB type C receptacle, its durability is around 10,000 cycles.
Q)-> Is it ok to think that the above be considered as 10,000 insertions and removals with voltage applied to the PDC device? I would like to confirm the insertion and removal (repeated sudden voltage application) with voltage applied.
Best Regards
Arai
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Hi,
No, this specification is defined only to measure the durability of the type C receptacle. This is not specific to any voltage range.
Regards,
Abhilash P