Hello Vasanth,
Thank you for the fast reply and for looking into my issue. I have created a SAR hardware configuration which is directly copied from the CE220974 example project. From what I can tell, it looks like it has some of those settings already configured. It's difficult to know since I have to initialize the structure in code without a GUI implementation, so I feel like I'm shooting in the dark a bit like with PSOC1.
Here is my structure ( the forum won't let me attach my .h file) :
/*******************************************************************************
* Constants for configuring Config1 of the Scan_ADC
*******************************************************************************/
/* Enable only channel 0. */
#define CONFIG1_CHAN_EN (1u)
/* Channel 0 is single ended.
* Aperture time is set by Sample Time 0.
* The DieTemp sensor is connected on the SARMUX_VIRT port at PIN_ADDR 0.
* The sensor is enabled once connection to the SAR ADC is made.
* Averaging is enabled. */
#define CONFIG1_CHAN0_CONFIG (CY_SAR_CHAN_SINGLE_ENDED \
| CY_SAR_CHAN_SAMPLE_TIME_0 \
| CY_SAR_POS_PORT_ADDR_SARMUX_VIRT \
| CY_SAR_CHAN_POS_PIN_ADDR_0 \
| CY_SAR_CHAN_AVG_ENABLE)
/* Single ended channels are signed.
* Averaging mode is set to sequential fixed with 32 samples of averaging. */
#define CONFIG1_SAMPLE_CTRL (CY_SAR_SINGLE_ENDED_SIGNED \
| CY_SAR_AVG_CNT_32 \
| CY_SAR_AVG_MODE_SEQUENTIAL_FIXED)
/* Channels 1 through 15 are unconfigured. */
#define CONFIG1_CHAN_CONFIG {(uint32_t)CONFIG1_CHAN0_CONFIG \
, 0uL, 0uL,0uL,0uL,0uL,0uL,0uL,0uL,0uL,0uL,0uL,0uL,0uL,0uL,0uL}
/* Enable the End of Scan interrupt only. */
#define CONFIG1_INTR_MASK (CY_SAR_INTR_EOS_MASK)
/* Use the internal 1.2 V bandgap reference for the SAR reference source.
* Enable the bypass capacitor connection.
* Connect the negative terminal for single ended channels to VSSA. */
#define CONFIG1_VREF_MV_VALUE (1200uL)
#define CONFIG1_CTRL (CY_SAR_VREF_SEL_BGR \
| CY_SAR_BYPASS_CAP_ENABLE \
| CY_SAR_NEG_SEL_VSSA_KELVIN)
/* Config1 will operate in single shot mode.
* Set the sample time to meet the DieTemp settling time requirement of 1 us.
* With a 16.67 MHz SAR clock, 17 cycles (or a value of 18 in the register)
* gives an aperture time of 1.02 us. */
#define CONFIG1_SAMPLE_TIME01 ((18 << CY_SAR_SAMPLE_TIME0_SHIFT) \
| (4 << CY_SAR_SAMPLE_TIME1_SHIFT))
/* Set the sample times for 2 and 3 to be 4 clock cycles.
* Note that these two sample times are not used by any channels and only shown for reference. */
#define CONFIG1_SAMPLE_TIME23 ((4 << CY_SAR_SAMPLE_TIME2_SHIFT) \
| (4 << CY_SAR_SAMPLE_TIME3_SHIFT))
/* Set the initial state of switches.
* Close the switch between the DieTemp sensor and the positive terminal of the SAR (TEMP_VPLUS).
* Close the switch between VSSA and the negative terminal of the SAR (VSSA_VMINUS). */
#define CONFIG1_MUX_SWITCH0 (CY_SAR_MUX_FW_VSSA_VMINUS \
| CY_SAR_MUX_FW_TEMP_VPLUS)
/* Enable sequencer control for the VSSA and TEMP switches.
* While unnecessary in this design because there is only one channel in Config1,
* the code is provided for reference for designs with multiple channels. */
#define CONFIG1_MUX_SWITCH_SQ_CTRL (CY_SAR_MUX_SQ_CTRL_VSSA \
| CY_SAR_MUX_SQ_CTRL_TEMP)
/* Define the initialization structure for ADC stucture Config1. */
#define ADC_DIE_TEMP_CONFIG const cy_stc_sar_config_t Die_Temp_ADC_config = \
{ \
.ctrl = (uint32_t)CONFIG1_CTRL, \
.sampleCtrl = (uint32_t)CONFIG1_SAMPLE_CTRL, \
.sampleTime01 = CONFIG1_SAMPLE_TIME01, \
.sampleTime23 = CONFIG1_SAMPLE_TIME23, \
.rangeThres = CY_SAR_DEINIT, \
.rangeCond = CY_SAR_RANGE_COND_BELOW, \
.chanEn = CONFIG1_CHAN_EN, \
.chanConfig = CONFIG1_CHAN_CONFIG, \
.intrMask = CONFIG1_INTR_MASK, /* */ \
.satIntrMask = CY_SAR_DEINIT, /* Disable the saturation interrupt. */ \
.rangeIntrMask = CY_SAR_DEINIT, /* Disable the range interrupt. */ \
.muxSwitch = CONFIG1_MUX_SWITCH0, \
.muxSwitchSqCtrl = CONFIG1_MUX_SWITCH_SQ_CTRL, \
.configRouting = true, \
.vrefMvValue = CONFIG1_VREF_MV_VALUE, \
}
I then switch to the Die Temp configuration here in main:
Here I am just switching from the GUI config to the die temp config. I have disabled switching back to the original configuration for the moment ( and as you can see with my commented code I have tried multiple combinations of starting and stop conversions, de-intializing the config, and with both continuous mode and single shot). What happens is that I get one successful conversion with the original GUI configuration, but all conversion stops when I initialize the Die temp configuration. It also doesn't work when I switch back to the working configuration. I am monitoring the raw ADC results over I2C.
