Aug 12, 2022
07:30 AM
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Aug 12, 2022
07:30 AM
We are trying to measure the Sector Erase time for S29GL032N.
We want to know how the Min and Max given in the datasheet (0.5 Sec and 3.5Sec) (Page 70) are mentioned. What are the test conditions and which sectors these readings are applicable?
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Memory Nor Flash
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2 Replies
Aug 12, 2022
10:01 AM
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Aug 12, 2022
10:01 AM
Hello,
Thank you for contacting Infineon Technologies.
- The test conditions for the given Sector Erase time are as follows:
- Temp = 25C, VCC = 3.0V, 10,000 cycles; checkerboard data pattern.
- Under worst case conditions of 90C; Worst case VCC, 100,000 cycles.
- The overall Sector Erase time is dependent on the data pattern programmed into the main memory array of S29GL032N and overall Sector Erase Time is Sector Erase + Pre-programming.
- The readings do not depend on the sectors but they depend on the pattern that resides inside these sectors. Therefore, it is not possible to determine which particular sectors these readings are applicable for.
Please let me know if I can answer any other questions.
Thank you!
Regards,
Harshita Lokesh
Aug 18, 2022
08:33 AM
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Aug 18, 2022
08:33 AM
Hello Anil,
Did the above reply answer your question? Please let me know if I can answer any other questions.
Thank you!
Regards
Harshita Lokesh