In the CY14B256LA data sheet under maximum device ratings on page 8 there is a maximum accumulated storage time:
Maximum accumulated storage time:
At 150 °C ambient temperature .......................1000 h
At 85 °C ambient temperature ..................... 20 years
Are these limitations against the non-volatile storage of data or is this with respect to the useful life of the component?
As those are the maximum ratings, so after that time, the useful life of the device will be reduced, and it may cause permanent damage, which can make the data unreliable. We can't guarantee anything if you are beyond the maximum rating limit.
Could you provide the relationship, or an equation, describing the life vs duration at temperature between 85C and 150C? This relationship is needed to enable a life prediction for a given temperature / duration profile?
Thank you but I've already have this paper, it refers to the data retention while the original answer was against component life"... so after that time, the useful life of the device will be reduced, and it may cause permanent damage, which can make the data unreliable."