CY14B256LA Component Life

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John_Hair
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First reply posted First question asked Welcome!

In the CY14B256LA data sheet under maximum device ratings on page 8  there is a maximum accumulated storage time:

Maximum accumulated storage time:

At 150 °C ambient temperature .......................1000 h

At 85 °C ambient temperature ..................... 20 years

Are these limitations against the non-volatile storage of data or is this with respect to the useful life of the component?

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Ritwick_S
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Hi @John_Hair,

 

As per the datasheet, after 20 years (at 85C), we do not guarantee the device's data retention characteristic. This does not mean that the device will be damaged.

 

Thanks,

Ritwick

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Ritwick_S
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100 solutions authored 25 likes received 250 sign-ins

Hi @John_Hair,

 

As those are the maximum ratings, so after that time, the useful life of the device will be reduced, and it may cause permanent damage, which can make the data unreliable. We can't guarantee anything if you are beyond the maximum rating limit.

 

Thanks,

Ritwick

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John_Hair
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First reply posted First question asked Welcome!

Could you provide the relationship, or an equation, describing the life vs duration at temperature between 85C and 150C? This relationship is needed to enable a life prediction for a given temperature / duration profile? 

 

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Ritwick_S
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Hi @John_Hair,

 

Please refer to the Whitepaper- Data Retention Performance of 130-nm nvSRAM for more details on retention time vs. temperature.

 

Thanks,

Ritwick

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John_Hair
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First reply posted First question asked Welcome!

Ritwick,

Thank you but I've already have this paper, it refers to the data retention while the original answer was against component life"... so after that time, the useful life of the device will be reduced, and it may cause permanent damage, which can make the data unreliable."

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Ritwick_S
Moderator
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100 solutions authored 25 likes received 250 sign-ins

Hi @John_Hair,

 

As per the datasheet, after 20 years (at 85C), we do not guarantee the device's data retention characteristic. This does not mean that the device will be damaged.

 

Thanks,

Ritwick

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