MOTIX™ MCU Forum Discussions

Hello I have a question about the low level driver for the TLE987x Microcontrollers. 

The following link shows the infineon web page and the information of the low level driver for the MOTIX Microntroller. 
Low Level Driver - Infineon Technologies
There the following sentence is written:
The free package contains the source code, the documentation, the API documentation and release notes.

I got the source code from the config wizard for MOTIX. Also the release notes can be seen in this application.  
So my question is where can I find the documentation and the API documentation for the free MOTIX Low level driver 

Thanks, 

Stefan

 Hi,

What are the requirements for power supply (VDH) ramp-up? Unfortunately, I didn't find such either in the Users Manual or in the devices's data sheets. 

I noticed a different behavior depending on the VDH ramp-up. Under slowly increasing voltage seems that some of the microcontroller's modules are not reset properly, because they do not work as expected, the BDRV for example, or LIN.

Are there any reference designs for Reset Pin, that may help the device to start up properly on a slowly increased VDH?

Best Regards,

Tenko Yavashev

The TLE9853QX is configured in bi-directional design similar to the evaluation board.

My question is about repeatability, accuracy, of the CSA value after gain at ADC1_OUT_CH13. 

I have the PCB assemblies configured in a controlled environment where I can generate a fixed load current while operating the processor in Debug. I recorded A2D values while setting the load at fixed current values. I record the values in 5 Amp increments from 75 Amps to 165 Amps. The hand written values attached were recorded. I then repeated the test an hour later and all the values are 5% higher. What accuracy can be achieved? 

Will the TLE9853QX always generate the same A2D value at ADC1_OUT_CH13 on a particular TLE9853QX every time the same input value is applied in the same environmental conditions? Or, will the A2D value at ADC1_OUT_CH13 always fluctuate within the tolerances of the part each time?

I have not been able to achieve any A2D values close to the calculated values in the attached document.

In Config Wizard Channel 13  (CSA) is Calibration enabled. See attached.

Table 80 in the TLE9853QX data sheet list a 5% tolerance for differential gain, uncalibrated.

Enabling calibration in Config wizard leads me to Table 57 in the TLE9853QX data sheet. Are these tolerances listed for the values read at OP1 and OP2 or the ADC1_OUT_CH13?

Table 57 in the TLE9853QX data sheet values are for a gain of 40. Are the values the same when using a gain of 60?

I have attached a partial schematic of the current sense circuit for reference. Shunt is 1%, 200uOhms. 

Please provide any guidance possible guidance. I am only using the differential amplifier to protect the design from over current in the application and I need to know how to properly use the feature.

Hi All,

Is it possible to control one or two outputs only? For example, let's say I would like to turn on GL1 only. What shall be the CCU6 configuration then? 

Judging by the existence of all bits LSx_ON and HSx_ON on BDRV->CTRL1/2, it shall be possible. But no matter how hard I tried, I didn't succeed. 🙄

Thanks to all in advance,

Tenko Yavashev

The question description of IAR software to develop TLE9879 chip

Question：
When I use IAR software to import Infineon pack, l find that the pack of Infineon can not be imported, please tell me which kind of Infineon pack l should to import to develop TLE9879.if you can give me an example, l will very appreciate you.

IAR version：8.32.1

In IAR software Release Notes，l check the device support，ensure that 8.32 version support TLE9879.

Infineon pack ：Version 1.6.0(2022-12-22) and Version 1.5.2 can not import success.

TLE9879QXA40 

We are using TLE9879-BLDC-Shield to control a four pole (two pair) BLDC motor. Best results are obtained by setting HALL_OFFSET_60DEGREE_EN to 0 and HALL_ANGLE_DELAY_EN to 0. However, the maximum clockwise rotation speed is greater than counterclockwise. In addition, even when non-maximum values are selected, the clockwise speed is kept stable, while the counterclockwise speed fluctuates greatly.
We are probably setting some parameters incorrectly, since we are new to using this board. Please suggest what parameters should be used to ensure the same movement in both directions.

Hi team,

I am working on the TLE9879QXA40, My requirement is to access the entire ROM, I found the ROM size as below:

But when I try to access the ROM above the address 0x1101F000, I can't read the data above the ROM address 0x1101F000 because the in keil target options the ROM size is 0x1EFFC (starting address of ROM i.e., 0x11000000 + 0x1EFF= 0x1101F000)

as below and facing an error 

Error when tried to read the data above the address 0x1101F000:

But when I try to increase the ROM size in target options of keil I am facing an error as below:

My query is how can I read the data of ROM (flash) above the address of 0x1101F000.

Hi Team,

This is the extension to the query given in the link below.  

Solved: Implementation of ECC errors in TLE9879 - Infineon Developer Community

1) In the solution provided example codes I found information about NVM mapping error, but I need Information about ECC for RAM and NVM(EEPROM). How to inject ECC errors for RAM and NVM.

2). I found the enabling functions for double bit ECC for both RAM and NVM and also clearing function for Single bit ECC as shown below can you please help me how to clear single bit ECC for NVM also. 

Doble bit ECC for RAM:  INLINE void ECC_RAM_DoubleBit_Int_En(void)

Doble bit ECC for NVM:  INLINE void ECC_NVM_DoubleBit_Int_En(void)

clear single bit ECC for RAM interrupt: INLINE void ECC_RAM_SingleBit_Int_Clr(void)

to summarize my queries are:

1)How to inject ECC single bit and double bit errors for RAM and NVM.

2) how to clear interrupt for single bit ECC for NVM.