Jan 22, 2023 10:26 PM
What is the recovery strategy for TLD1124EL device?
When the fault event is removed the device will recover automatically and no external reset is required.
The device has the following behavior during various fault events:
- Open load: the chip switches off. An OL condition is detected when VPS < VPS(OL) (P_8.3.10) for more than tOL (P_8.3.9). During the OL fault VOUT=Vs-VPS(OL). If the causing event is not present anymore, output will turn on again.
- Short circuit to GND: the chip switches off. A SC condition is detected when VOUT < VOUT(SC) (P_8.3.11) for more than tSC (P_8.3.12). If the causing event is not present anymore, output will turn on again.
- Over load: when the temperature exceeds certain threshold, Tj > Tj(CRT) (P_9.2.13), output current is reduced through IN_SET pin voltage (P_8.3.1), and eventually it will drop to zero if temperature continues to rise. When chip cools down, output current will regulate again.
- Reverse battery: chip integrates a protection mechanism against these events down to -16V (P_4.1.1). For events of high ISO-pulse requirements (VS < -16V) a reverse protection diode is needed (similar to Basic+). Reverse output current IOUT(rev)=3uA (P_9.2.3) (leakage current).
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