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AURIX™ MCU: Base failure rate SN29500-2 vs. IEC-TR 62380 - KBA236335

AURIX™ MCU: Base failure rate SN29500-2 vs. IEC-TR 62380 - KBA236335

Infineon_Team
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Question:

What is the basis for the failure rates used by Infineon?

 

Answer: For TC2xx, Infineon uses the Siemens Norm SN29500-2 (Edition 2010-09) as a source for failure rates for permanent random HW faults (HE). But for TC3xx, Infineon uses other references for failure rates, including IEC-TR 62380 and its reliability data. Customers can calculate the base failure rate (BFR) according to SN 29500-2 or IEC-TR62380 by using the IFX template. Failure rates for transient faults (SE) are derived from measurements performed by Infineon and our package suppliers.

The recommendation is to apply the IEC TR62380 as mentioned in ISO 26262-11 to get the value for λdie and λpackage. (This distinction is not possible when using SN29500).

 

Community Translation: AURIX™ MCU: 故障率 SN29500-2 vs. IEC-TR 62380 - KBA236335

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