May 05, 2014
04:16 AM
- Mark as New
- Bookmark
- Subscribe
- Mute
- Subscribe to RSS Feed
- Permalink
- Report Inappropriate Content
May 05, 2014
04:16 AM
Hi Infineon,
I am not sure, that Data modification (at VADC) - accumulation 4 results works well... Is there any example for this please?
I tried use this in my project:
I measure 1,25V (DC) on the pin ADC (12bit) ... in signle measure I see the 2048 as result.
But In accumulation 4 restult mode in the result is sometimes 2048, 4096, 6144, 8192. But there should by always only 8192.
Is this feature OK on XMC4500-F144x1024 AB ???
BR
Koumak
I am not sure, that Data modification (at VADC) - accumulation 4 results works well... Is there any example for this please?
I tried use this in my project:
I measure 1,25V (DC) on the pin ADC (12bit) ... in signle measure I see the 2048 as result.
But In accumulation 4 restult mode in the result is sometimes 2048, 4096, 6144, 8192. But there should by always only 8192.
Is this feature OK on XMC4500-F144x1024 AB ???
BR
Koumak
- Tags:
- IFX
1 Reply
Not applicable
May 06, 2014
03:50 AM
- Mark as New
- Bookmark
- Subscribe
- Mute
- Subscribe to RSS Feed
- Permalink
- Report Inappropriate Content
May 06, 2014
03:50 AM
Hi,
Did you use the configuration of GLOBRCR.DRCTR = 0011b to get the accumulated result in Global Result Event Interrupt?
BR,
Zain
Did you use the configuration of GLOBRCR.DRCTR = 0011b to get the accumulated result in Global Result Event Interrupt?
BR,
Zain