AURIX™ Forum Discussions

Hi, 

  I want to know how to change this part code to meet my board's multiple receivable IDs function. like

filter.id1 = 0x100;

filter.id2 = 0x139;

filter.id3 = 0x234;

  Can you help me?

  Thanks very much.

SAL-TC387QP-160F300S AD 

Hello Forum,

We are using TC332 microcontroller, we have used MBIST testing with Nondestructive test method.
These tests are providing positive reply of no error during testing.

As per FuSa guidelines, we needed to test the RAM errors and Pflash errors by injecting ECC errors.

Please guide to test the errors.

Thanks

Hello Team,

I am using ADS for building example project which is based on iLLD framework , I have imported one of example code from ACV and I have try to build code.
I am suspecting that its not configure for build environments , could you guide me what all need to configure for build code.

Initial I am getting this error during build.

Hi,

I use example "GTM_TIM_Capture_1_KIT_TC375_LK" to measure a 24M input clock.  Since the input from an external clock, thus I don't need function "generate_PWM".  I tested on TC377 board.

But in my test,  I sometimes get 25M, and sometimes,  get ~20M:

ADSC/P: GTM freq 20833334
ADSC/P: GTM freq 25000000
ADSC/P: GTM freq 25000000
ADSC/P: GTM freq 20833334
ADSC/P: GTM freq 25000000

by using of filter mode (like bellow), no help. I print "driver->glitch" in IfxGtm_Tim_In_update, it never set:
configTIM.filter.risingEdgeMode = IfxGtm_Tim_In_ConfigFilterMode_individualDeglitchTimeUpDown;
configTIM.filter.fallingEdgeMode = IfxGtm_Tim_In_ConfigFilterMode_individualDeglitchTimeUpDown;

Do you have any insights about it?

Thanks

-Austin

When I was developing the product, I used the XC2267 chip to perform two reads and writes every time I read peripheral register data. The waveform of IIC communication is not a problem, and I don't know where the problem lies. Is there a reference to the IIC read and write related routines for this chip

Hi. 
I have  a TC397 microcontroller and I am running AUTOSAR code on it.
Is there any way to stress test it?
Do you know any software or tool to do that?

I have the following use case:  Using TC36x, storing 2 applications (APP1 - main application and APP2 - secondary application). In the APP1 I want to check if APP2 is available (flashed on microcontroller). To do that I perform a dummy access (read access) to the start address of the APP2. 

The behavior is simple, if APP2 is not flashed a Trap 4 TIN 2 will be triggered.

The issue that I'm facing right now is to recover from exception to the next instruction from the one that triggered the exception first. 

#Step 1: Dummy read access

unsigned long loc_TestSwStartAddr = 0xA04F0000;
unsigned long* loc_DummyAccess = 0U;

/* Dummy Access - This will trigger a TRAP4 TIN 2 if APP2 is not flashed */
*loc_DummyAccess = *(unsigned long*)loc_TestSwStartAddr;

#Step 2: Jump to OS Trap Handler (rslcx+rfe)

#Step 3: Save snapshot data when the trap occurs (func call)

#Step 4: Jump to ProtectionHook (func call)

#Step 5:  Jump to APP1 specific trap handling ( func call). On this step I'm trying to go back at the next instruction which caused the trap but I didn't find a solution yet. 

What I tried:

-> saving the content of the registers FCX/LCX/PSW/PCXI before instruction that will cause the trap and restore it after we jump back somehow to the next instruction (-> context switch trap afterwards)

-> update the content of the A11 based of the information stored in the PCXI when trap occurs. (-> context switch trap afterwards)

Do you have any idea how can I proceed or maybe if there is any source code which is doing such a context restore?

Note: I've read the architecture manual of the microcontroller but was not so helpful.