Mar 03, 2020
02:52 AM
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Mar 03, 2020
02:52 AM
Hi all,
Why many Pflash ECC errors are reported on high temperature test while room temperature/low temperature tests are ok?
Best regards,
Lucas
#8042000 13143
Why many Pflash ECC errors are reported on high temperature test while room temperature/low temperature tests are ok?
Best regards,
Lucas
#8042000 13143
- Tags:
- IFX
3 Replies
Mar 03, 2020
06:08 AM
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Mar 03, 2020
06:08 AM
Hi Lucas,
Check flash waitstate if it is enough to cover the access delay by PMU_FCON.WSPFLASH. The default setting is calculated with lower fFSI. with higher fFSI, you need to configure more waitstates.
Best regards,
Mr. AURIX™
Check flash waitstate if it is enough to cover the access delay by PMU_FCON.WSPFLASH. The default setting is calculated with lower fFSI. with higher fFSI, you need to configure more waitstates.
Best regards,
Mr. AURIX™
Mar 10, 2020
09:52 AM
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Mar 10, 2020
09:52 AM
Hello Support,
What is the corresponding register for Aurix 2G devices?
Looks like PMU_FCON.WSPFLASH is for Aurix 1G devices.
Best Regards
What is the corresponding register for Aurix 2G devices?
Looks like PMU_FCON.WSPFLASH is for Aurix 1G devices.
Best Regards
Mar 10, 2020
10:05 AM
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Mar 10, 2020
10:05 AM
For TC3xx, check DMU_HF_PWAIT and DMU_HF_DWAIT.