Hello, we're struggling to create some built-in test software for the TC1793 that will verify that expected traps occur when a RAM or flash uncorrectable ECC error is detected. Specifically, we want to be able to test LMU and DSPR RAMs, and internal flash for ECC double-bit errors. Among other things, we've tried flipping a pair ECC bits via the SFAGEN register, but don't get a trap. Does someone have an existing code snippet or additional documentation that describes how to cause ECC double bit errors in these RAMs or internal flash for test purposes?
Thanks!
